Heterodyne interferometer arrangement with tunable lasers, a het

Details Heterodyne interferometer arrangement with tunable lasers, a het Heterodyne interferometer arrangement with tunable lasers, a het

1996-06-20

1998-07-21

Turner, Samuel A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356361, G01B 902

Patent

active

057841616

ABSTRACT:
The present invention is directed to a heterodyne interferometer arrangement with tunable laser light sources for absolute distance measurement. The phase angle changes which occur in the synthetic interference signals when varying the laser frequencies are recorded and evaluated. The arrangement also enables error-free distance measurement in the event of a change in the mathematical sign of the phase changes due to frequency jitter.

REFERENCES:
patent: 4907886 (1990-03-01), Dandliker
patent: 4912530 (1990-03-01), Bessho
patent: 5146284 (1992-09-01), Tabaralli et al.

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