Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1980-10-07
1982-04-20
Corbin, John K.
Optics: measuring and testing
By particle light scattering
With photocell detection
356361, G01B 902
Patent
active
043256350
ABSTRACT:
A method and apparatus for simply and accurately determining the index of refraction of semiconductor materials, etalon bars and materials transparent to infrared radiation. The channel spectra of the material is obtained by passing through it a portion of radiation from a continuously tuned diode laser. Another portion of the diode laser radiation is heterodyned with radiation from a CO.sub.2 laser to obtain heterodyne marker beats. The channel spectra and marker beats are displayed in conjunction whereby the frequency difference between the marker beats can be related to the number of fringes in the channel spectra between the marker beats.
REFERENCES:
Tanaka et al. "Laser Heterodyne Measurements of Photo-Inducal Refractive-ex Changes in Amorphous As-S Films", Optics Communications, vol. 19, No. 1, pp. 134-137, 10/76.
Lavan, "Optical Heterodyne Interferometer with Radio Frequency Phase Reference", Applied Optics, vol. 15, pp. 2627-2628, 11/76.
Ritter Kenneth J.
Sattler Joseph P.
Worchesky Terrance L.
Corbin John K.
Edelberg Nathan
Elbaum Saul
Gibson Robert P.
Koren Matthew W.
LandOfFree
Heterodyne indicial refractometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Heterodyne indicial refractometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Heterodyne indicial refractometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1261380