Heterodyne feedback system for scanning force microscopy and...

Details Heterodyne feedback system for scanning force microscopy and... Heterodyne feedback system for scanning force microscopy and...

2005-01-25

2005-01-25

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

06845655

ABSTRACT:
Frequency translation of microelectromechanical vibration signals such as a tip vibration signal in a scanning force microscopy system expands the versatility of existing control systems and enables new signal processing techniques. The vibration signal such as the cantilever probe tip vibration signal of a scanning force microscopy is frequency converted to a lower or higher frequency signal that is utilized to provide a control signal.

REFERENCES:
patent: 4851671 (1989-07-01), Pohl
patent: 5262643 (1993-11-01), Hammond et al.
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5641896 (1997-06-01), Karrai
patent: 5723775 (1998-03-01), Watanabe et al.
patent: 5939719 (1999-08-01), Park et al.
patent: 6005246 (1999-12-01), Kitamura et al.
patent: 6005251 (1999-12-01), Alexander et al.
patent: 6057546 (2000-05-01), Braunstein et al.
patent: 6073485 (2000-06-01), Kitamura
patent: 6265718 (2001-07-01), Park et al.
patent: 6310342 (2001-10-01), Braunstein et al.
D.A. Walters, et al., “Short Cantilevers for Atomic Force Microscopy,” Rev. Sci. Instrum., vol. 67, No. 10, Oct., 1996, pp. 3583-3590.
Mario B. Viani, et al., “Small Cantilevers for Force Spectroscopy of Single Molecules,” Journal of Applied Physics, vol. 86, No. 4, Aug. 15, 1999, pp. 2258-2262.
Ami Chand, et al., “Microfabricated Small Metal Cantilevers with Silicon Tip for Atomic Force Microscopy,” Journal of Microelectromechanical Systems, vol. 9, No. 1, Mar., 2000, pp. 112-116.

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