Hemispherical test head for integrated circuit tester employing

Details Hemispherical test head for integrated circuit tester employing Hemispherical test head for integrated circuit tester employing

1998-01-27

2000-06-20

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 324765, G01R 3102

Patent

active

060781874

ABSTRACT:
A test head for an integrated circuit tester includes a set of wedge-shaped node cards, one for each terminal of the integrated circuit device under test (DUT). Each node card holds circuits for carrying out all test activities at one DUT terminal including generating and transmitting a test signal to the DUT and receiving and processing a response signal produced by the DUT. The test and response signals pass through an I/O terminal at a narrow end of the node card. A card frame having hemispherical inner and outer shells holds the node cards substantially therebetween with the I/O terminal of each card protruding through an aperture in the inner shell. A centroid distributor having substantially a hemispherical shaped surface nesting within the inner shell of the card frame holds a set of first terminals in contact with the node card I/O terminals. A set of conductors within the centroid distributor interconnect each first terminal with a corresponding second terminal on a flat surface of the distributor. A load board assembly holds the DUT and a connector assembly links each second terminal of the centroid distributor to a contact on the load board providing access to a DUT terminal. A pump evacuating air from a space between the inner shell of the card frame and the centroid distributor draws cooling air across the node cards.

REFERENCES:
patent: 4517512 (1985-05-01), Petrich et al.
patent: 5060111 (1991-10-01), Takashima
patent: 5747994 (1998-05-01), Suga
patent: 5834946 (1998-10-01), Albrow et al.

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