Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1992-06-22
1993-12-21
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1114
Patent
active
052725170
ABSTRACT:
In a height measurement apparatus, a laser light beam is applied to a surface of a height-measurement object. A portion of the laser light beam is reflected at the surface of the object. An optical position sensor is exposed to the portion of the laser light beam which is reflected at the surface of the object. The optical position sensor generates a position signal depending on a point at which the reflected laser light beam meets the optical position sensor. The position signal represents a height of the surface of the object. A position of the laser light beam is vibrated relative to the surface of the object. The height represented by the position signal is temporally averaged into a mean height while the position of the laser light beam is vibrated relative to the surface of the object. The mean height is defined as a final measurement result.
REFERENCES:
patent: 4589773 (1986-05-01), Ido et al.
patent: 4971443 (1990-11-01), Koyagi
Matsushita Electric - Industrial Co., Ltd.
Rosenberger Richard A.
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