Heel effect compensation filter X-ray irradiator, X-ray CT...

X-ray or gamma ray systems or devices – Beam control – Filter

Reexamination Certificate

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C378S145000, C378S156000

Reexamination Certificate

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10594513

ABSTRACT:
A heel effect compensation filter is configured to have a thickness distribution that uniforms an X-ray intensity angular distribution that is nonuniform in the body axis direction of a subject in an X-ray flux irradiated space. The space is formed by an X-ray flux diverging from an anode in a body width direction of the subject and diverging in a shape of an approximate sector in the body axis direction due to the heel effect, when the X-ray flux generated on the anode by irradiating a thermoelectron beam flux from a cathode to the anode is irradiated on the subject. The thickness distribution can be obtained using a predetermined formula.

REFERENCES:
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patent: 6968042 (2005-11-01), Toth et al.
patent: 2005/0058254 (2005-03-01), Toth et al.
patent: 2005/0123100 (2005-06-01), Hsieh
patent: 2006/0062353 (2006-03-01), Yatsenko et al.
patent: 2006/0256925 (2006-11-01), Virshup et al.
patent: 2000-790114 (2000-03-01), None
patent: 2004-214130 (2004-07-01), None
“Mechanical Engineering of X-ray CT Scanner (5)-Artifact-, 6, Artifact Due to Cone-Angle of Multi-Slice CT”, Jun. 2002, pp. 733-739.

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