Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate
2007-07-10
2007-07-10
Everhart, Caridad (Department: 2891)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
C257SE21529, C438S017000
Reexamination Certificate
active
10867712
ABSTRACT:
A reference value, which defines electric power to be supplied to a heating element, is generated. Deviation ΔT of temperature T1measured by a radiation thermometer from target temperature T0defined by a target temperature rising curve is determined. Compensation value is determined based on the deviation ΔT and the temperature T1. The reference value is multiplied by the compensation value. The heating element is supplied with electric power according to the corrected reference value.
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Everhart Caridad
Tokyo Electron Limited
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