Heat treatment apparatus and heat treatment method

Semiconductor device manufacturing: process – Including control responsive to sensed condition

Reexamination Certificate

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C257SE21529, C438S017000

Reexamination Certificate

active

10867712

ABSTRACT:
A reference value, which defines electric power to be supplied to a heating element, is generated. Deviation ΔT of temperature T1measured by a radiation thermometer from target temperature T0defined by a target temperature rising curve is determined. Compensation value is determined based on the deviation ΔT and the temperature T1. The reference value is multiplied by the compensation value. The heating element is supplied with electric power according to the corrected reference value.

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patent: 199 07 497 (2000-08-01), None
patent: 11-008180 (1999-01-01), None
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patent: WO 00/51170 (2000-08-01), None

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