Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-18
2005-10-18
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090
Reexamination Certificate
active
06956392
ABSTRACT:
An apparatus for transferring heat from semiconductor devices during a burn-in operation is disclosed. The apparatus includes a substantially planar base board through which a plurality of openings are extended. Heat sinks coordinated with the openings are connected to biasing members and come in contact with the semiconductor devices during the burn-in operation for transferring heat from the devices.
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Brady III Wade James
Tang Minh N.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Tung Yingsheng
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