Heat-flux based emissivity/absorptivity measurement

Details Heat-flux based emissivity/absorptivity measurement Heat-flux based emissivity/absorptivity measurement

2008-01-15

2008-01-15

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Emissivity determination

C374S030000

Reexamination Certificate

active

07318671

ABSTRACT:
A mechanism and method for directly observing data from which the thermal emissivity or absorptivity of a surface can be calculated. The invention teaches the use of a substantially planar heat-flux or heat-flow sensor employing a thermopile, to measure the rate of heat dissipation from a radiating surface thermally attached to one side of the heat-flux sensor where the radiating surface is exposed to a first temperature and where the second side of the heat flux sensor is in thermal contact with a heat source at a second higher temperature.

REFERENCES:
patent: 4117712 (1978-10-01), Hager, Jr.
RdF HF S-LII Heat Flux Sensors; 3 Pages.

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