Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1997-11-18
1999-08-17
Shah, Kamini
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
374 43, 62 37, 62 33, 7320419, G01N 2518
Patent
active
059407840
ABSTRACT:
An apparatus, such as, a heat flow meter instrument, for measuring thermal properties of a specimen includes a first thermoelectric device and a second thermoelectric device, each device being thermally coupled to a hot plate and a cold plate, and a heat flow transducer, thermally connectable to a specimen and constructed to measure heat flowing through the specimen. The heat flow transducer and the specimen are positionable in thermal contact between the hot plate of the first thermoelectric device and the cold plate of the second thermoelectric device. The apparatus also includes an electric power supply connected to provide controlled amounts of electric power to the first and second thermoelectric devices to maintain the plates at selected temperatures, and a processor connected to receive from the heat flow transducer a signal corresponding to the measured heat. The processor is programmed to calculate a thermal property of the specimen based on the temperatures and the measured heat. The apparatus includes a closed loop heat exchange system, thermally connecting the cold plate of the first thermoelectric device and the hot plate of the second thermoelectric device, constructed and arranged to transfer heat between the plates. The closed loop heat exchange system may include a fluid pump and a first set of conduits thermally connected to the cold plate of the first thermoelectric device and a second set of conduits thermally connected to the hot plate of the second thermoelectric device. The conduits convey a heat exchange fluid in a closed loop arrangement.
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Metrisa, Inc.
Shah Kamini
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