Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2006-07-11
2006-07-11
Gutierrez, Diego (Department: 2859)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C977S867000, C977S863000, C977S876000, C374S137000
Reexamination Certificate
active
07073937
ABSTRACT:
A heat emitting probe including a conductive nanotube probe needle with its base end fastened to a holder and its tip end protruded, a heat emitting body formed on the probe needle, a conductive nanotube lead wire fastened to the heat emitting body, and an electric current supply that causes an electric current to pass through the conductive nanotube lead wire and both ends of the probe needle. The tip end of the probe needle is thus heated by an electric current flowing through the heat emitting body. A heat emitting probe apparatus includes the above-described heat emitting probe, a scanning mechanism that allows the heat emitting probe to scan over a thermal recording medium, and a control circuit that causes the tip end of the probe needle to emit heat, thus recording extremely small hole patterns in the surface of a thermal recording medium.
REFERENCES:
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 4918309 (1990-04-01), Beha et al.
patent: 4954704 (1990-09-01), Elings et al.
patent: 5047637 (1991-09-01), Toda
patent: 5388323 (1995-02-01), Hopson et al.
patent: 5441343 (1995-08-01), Pylkki et al.
patent: 5824470 (1998-10-01), Baldeschwieler et al.
patent: 5929438 (1999-07-01), Suzuki et al.
patent: 5969238 (1999-10-01), Fischer
patent: 6071009 (2000-06-01), Clyne
patent: 6146227 (2000-11-01), Mancevski
patent: 6159742 (2000-12-01), Lieber et al.
patent: 6233206 (2001-05-01), Hamann et al.
patent: 6528785 (2003-03-01), Nakayama et al.
patent: 6636050 (2003-10-01), Nakayama et al.
patent: 6703615 (2004-03-01), Nakayama et al.
patent: 6735046 (2004-05-01), Nakayama et al.
patent: 6777693 (2004-08-01), Nakayama et al.
patent: 6787769 (2004-09-01), Nakayama et al.
patent: 2002/0084410 (2002-07-01), Colbert et al.
patent: 2002/0112814 (2002-08-01), Hafner et al.
patent: 2002/0121897 (2002-09-01), Mukasa et al.
patent: 2002/0122766 (2002-09-01), Lieber et al.
patent: 2003/0189351 (2003-10-01), Nakayama et al.
patent: 2004/0074288 (2004-04-01), Shirakawabe et al.
patent: 2005/0017171 (2005-01-01), Samuelson et al.
patent: 2000321292 (2000-11-01), None
Harada Akio
Nakayama Yoshikazu
Daiken Chemical Co., Ltd.
Gutierrez Diego
Jagan Mirellys
Koda & Androlia
Yoshikaza Nakayama
LandOfFree
Heat emitting probe and heat emitting probe apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Heat emitting probe and heat emitting probe apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Heat emitting probe and heat emitting probe apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3556069