Optics: measuring and testing – Lamp beam direction or pattern
Patent
1997-12-04
1999-06-15
Kim, Robert H.
Optics: measuring and testing
Lamp beam direction or pattern
2802019, G01J 100, G01J 120
Patent
active
059127317
ABSTRACT:
An optical wavefront sensor for measuring phase tilt in two dimensions across the cross section of a beam (14), using only a single lenslet array (26) and a single camera sensor array (28). The rectangular lenslet array (26) is oriented at 45 degrees to first and second orthogonal sets of axes defining multiple points of interest (22') in the beam cross section, such that each lenslet subaperture is centered (at 40) between adjacent points of interest on the first and second axes. The points of interest (22') are locations corresponding to the positions of actuators (22) in an adaptive optics system. The camera sensor array (28) has more cells per unit area than there are subapertures per unit area. Only selected cells are activated, to provide for measurements at the approximate mid-points of lines between adjacent points of interest (22') on the first and second orthogonal axes. Thus the sensor array (28) has enough active cells to effect measurements in both orthogonal directions without interference between the cells used for measurement in the two directions, and without the need for multiple lenslet arrays or sensor arrays.
REFERENCES:
patent: 4141652 (1979-02-01), Feinleib
patent: 5233174 (1993-08-01), Zmek
DeLong Raymond K.
Hutchin Richard A.
Kim Robert H.
Merlino Amanda
TRW Inc.
Yatsko Michael S.
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