Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-05-24
2005-05-24
Bali, Vikkram (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S147000
Reexamination Certificate
active
06898304
ABSTRACT:
A method and apparatus for parallel processing of data without the need for cross-communication or synchronization between processing nodes is provided. The system is especially suitable for use in a wafer inspection system for the semiconductor industry. Embodiments include scanning a small area of the wafer, and distributing pixel data among a plurality of processing nodes, each of which accept and process an optimal amount of pixel data independently of the other processing nodes, thereby enabling increased throughput without increasing system complexity.
REFERENCES:
patent: 4532650 (1985-07-01), Wihl et al.
patent: 4681442 (1987-07-01), Wagner
patent: 5185812 (1993-02-01), Yamashita et al.
patent: 5699447 (1997-12-01), Alumot et al.
patent: 5699477 (1997-12-01), McCree
patent: 5982921 (1999-11-01), Alumot et al.
patent: 6020957 (2000-02-01), Rosengaus et al.
patent: 6122046 (2000-09-01), Almogy
patent: 0 189 943 (1986-08-01), None
International Search Report dated Jan. 7, 2004.
Naftali Ron
Rubinovich Vitaly
Bali Vikkram
McDermott & Will & Emery
LandOfFree
Hardware configuration for parallel data processing without... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Hardware configuration for parallel data processing without..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hardware configuration for parallel data processing without... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3395053