Handler used in testing system for semiconductor devices

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 731, 324158R, 1983391, 198952, 414224, G01R 3126, B65G 4700

Patent

active

051481006

ABSTRACT:
A handler used in a testing system for semiconductors includes an arm shaped conveyer unit for conveying a semiconductor device from a first end thereof to a second end thereof and vice versa,a loader/unloader unit which is provided at the first end of the conveyer unit, a setting unit which is provided at the second end of the conveyer unit, and an adjusting unit for adjusting the setting unit on a testing position which is a predetermined position with respect to a test head. The conveyer unit includes a ring shaped conveyer belt which is rotated between the first end of the conveyer unit and the second end thereof, and a plurality of holders each of which is fixed on an outer surface of the conveyer belt and holds the semiconductor device. The loader/unloader unit includes a first tray for storing a non-tested semiconductor device, a second tray for storing a tested semiconductor device, and a moving mechanism for moving the non-tested semiconductor device from the first tray to the conveyer unit and for moving the tested semiconductor device, which has been conveyed by the conveyer unit to the first end thereof, from the conveyer unit to the second tray. The setting unit includes a mechanism for setting the non-tested semiconductor device on the test head and for returning the tested semiconductor device from the test head to the conveyer unit, the conveyer unit then conveying the tested semiconductor device from the second end thereof to the first end thereof.

REFERENCES:
patent: 3408565 (1968-10-01), Frick et al.
patent: 3412333 (1968-11-01), Frick et al.
patent: 3797632 (1974-03-01), Riggs
patent: 4674181 (1987-06-01), Hamada et al.
patent: 4747479 (1988-05-01), Herrman
patent: 4907701 (1990-03-01), Kobayashi et al.

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