Hall effect device test circuit

Details Hall effect device test circuit Hall effect device test circuit

1982-07-07

1985-04-30

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324202, 324228, G01R 3100, G01R 3312

Patent

active

045146870

ABSTRACT:
A test circuit which detects Hall effect device operate and release time failures. This circuit includes a magnetic field circuit, a comparison circuit, a storage circuit and a visual indication circuit. The magnetic field circuit causes a Hall effect device under test to periodically switch states. The operate and release times of such switching is compared to predetermined thresholds by the comparison circuit. Switching times within the allowable thresholds cause the storage circuit to operate the visual indication circuit.

REFERENCES:
patent: 3621334 (1971-11-01), Burns et al.
patent: 4084135 (1978-04-01), Enabnit
patent: 4156191 (1979-05-01), Knight et al.
patent: 4190799 (1980-02-01), Miller et al.
patent: 4230987 (1980-10-01), Mordwinkin
patent: 4270087 (1981-05-01), Littwin

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