Hall effect device test circuit

Details Hall effect device test circuit Hall effect device test circuit

1982-08-30

1984-12-11

Levy, Stewart J.

Electricity: measuring and testing

Magnetic

Calibration

324235, 324251, 338 32H, G01R 3500

Patent

active

044881126

ABSTRACT:
A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, a voltage switching circuit, a comparison circuit, a retriggerable monostable multivibrator circuit and a visual indicator circuit are included. The comparison circuit compares the Hall effect device switching voltage to a predetermined threshold and controls the multivibrator circuit which causes a visual pass/fail signal to be provided.

REFERENCES:
patent: 4084135 (1978-04-01), Enabnit
patent: 4099238 (1978-07-01), Suzuki
patent: 4156191 (1979-05-01), Knight et al.
patent: 4190799 (1980-02-01), Miller et al.
patent: 4230987 (1980-10-01), Mordwinkin
patent: 4270087 (1981-05-01), Littwin

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