Hall effect device test circuit

Details Hall effect device test circuit Hall effect device test circuit

1982-10-29

1985-01-01

Levy, Stewart J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, 324202, 324228, 324252, G01R 3300

Patent

active

044917945

ABSTRACT:
A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.

REFERENCES:
patent: 2979654 (1961-04-01), Storm et al.
patent: 3614609 (1971-10-01), Grubel et al.
patent: 3649912 (1972-03-01), Nakamura
patent: 4190799 (1980-02-01), Miller et al.
patent: 4230987 (1980-10-01), Mordwinkin
patent: 4340861 (1982-07-01), Spaeks

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