Half-maximum threshold circuit for optical micrometer

Details Half-maximum threshold circuit for optical micrometer Half-maximum threshold circuit for optical micrometer

1977-01-06

1978-06-27

Sacher, Paul A.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

250560, 356167, G01B 1108

Patent

active

040971589

ABSTRACT:
An optical micrometer includes circuit means for determining accurately the passage of a scanning beam of light across the edges of an article placed within the zone of measurement. By sensing the half power point of the beam as received by a photodetector, the accuracy of the measurement is made independent of the intensity of the scanning beam. The half power point is determined by comparing the amplitude of the photodetector output signal with its responsive half amplitude value. Since it is not possible to determine half-amplitude value until after full amplitude has been reached, delay means are provided, the amount of delay being determined by the dimensions of the beam and the scanning rate.

REFERENCES:
patent: 3712741 (1973-01-01), Revert
patent: 3782834 (1974-01-01), Fujimori et al.
patent: 3844659 (1974-10-01), Baganoff

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