Hacker-proof one time programmable memory

Static information storage and retrieval – Read only systems – Fusible

Reexamination Certificate

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Details

C365S189080, C365S230060

Reexamination Certificate

active

06707696

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to one time programmable memory arrays, and more particularly to one time programmable (OTP) memory arrays that are hacker proof using current hacking techniques.
2. Related Art
FIG. 1
illustrates a conventional OTP memory cell array that is initialized to a known state at power up or reset. For example, in the OTP memory cell array
101
of
FIG. 1
, the known state is set to all zeros.
FIG. 2
illustrates the conventional OTP memory cell array
101
with the bits flipped to the programmed state. The bit flipping causes a detectable edge transition, which can be detected by sophisticated equipment such as E-beam probes, used by hackers today.
FIG. 3
illustrates a conventional set top TV decoder box
301
. The decoder box
301
includes a chip
302
that has the OTP memory cell array
101
and a processor
305
that compares encryption keys. The encryption keys are used to prevent hacking of the information stored in the system. The OTP memory cell array
101
holds one-half of the key, and an external SRAM
306
holds the other half of the key. Both keys are compared by the processor
305
.
Thus, a particular problem that exists in the set top box industry is the ever increasing sophistication of hackers. Hackers often attempted to obtain unauthorized access key by accessing the key embedded in the set-top box. This typically involved the opening of the chip package, and examination of the chip under a microscope. In the early OTP memory arrays, this would easily yield the key, particularly since the key was identical for thousands of boxes.
Later, as the OTP memories became more sophisticated, so did the techniques used by hackers to discover the key embedded in the memory. Such techniques include, for example, the use of X-rays, E-beam probes, etc. Such techniques can frequently detect the rapid transition of a bit from one state to another during power up.
Conventional OTP memories can be hacked, and their contents can be discovered by several methods. A poly fuse OTP can be X-rayed and the fuses can visually be seen. A gate oxide fuse type OTP memory can be connected to an E-beam probe station and the bits can be observed at power up to determine their state—assuming the OTP memory has an initial state.
Accordingly, what is needed is a method and system that prevents a hacker from using the power up sequence to discover the secure key embedded in the OTP memory.
BRIEF SUMMARY OF THE INVENTION
Accordingly, the present invention is directed to a hacker-proof OTP memory that substantially obviates one or more of the disadvantages of the related art.
There is provided a one time programmable memory array. A write circuit outputs data to the one time programmable memory array. A power up write controller outputs the data and a write enable signal to the write circuit. A read circuit outputs data from the one time programmable memory array upon a read enable signal received from a read controller. An address decoder communicates with the power up write controller and the read controller, for providing an address to the one time programmable memory array.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the invention. The advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.


REFERENCES:
patent: 6101605 (2000-08-01), Buer
patent: 6525955 (2003-02-01), Smith et al.
patent: 2003/0123314 (2003-07-01), Buer et al.
patent: 2003/0128576 (2003-07-01), Smith et al.

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