Guide device and test apparatus for electronic devices

Details Guide device and test apparatus for electronic devices Guide device and test apparatus for electronic devices

2011-05-24

2011-05-24

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07948251

ABSTRACT:
The present invention relates to a guide device comprising a baseplate unit having formed therein a guide channel for guiding electronic devices, wherein at least two portions of the baseplate unit are spatially fixed, said guide device being characterized in that means for compensating the thermal expansion of the baseplate unit are provided. The invention additionally relates to a test apparatus which comprises the guide device according to the present invention.

REFERENCES:
patent: 4579527 (1986-04-01), Wedel et al.
patent: 6069482 (2000-05-01), Hilton
patent: 6251835 (2001-06-01), Chu et al.
patent: 6744268 (2004-06-01), Hollman
patent: 7245137 (2007-07-01), Eldridge et al.
patent: 19708291 (1998-09-01), None
patent: 0291144 (1988-11-01), None

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