Group of circuits and testing method thereof and testing...

Details Group of circuits and testing method thereof and testing... Group of circuits and testing method thereof and testing...

2008-07-09

2011-10-04

He, Amy (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S076110

Reexamination Certificate

active

08030945

ABSTRACT:
A Group of circuits and a testing method thereof and a testing machine thereof are provided. In the testing method, a first voltage of a first circuit is adjusted to be a second voltage according to a first adjusting signal, wherein the second voltage is closer to a standard voltage compared to the first voltage. Further, a third voltage of a second circuit is adjusted to be a forth voltage according to a second adjusting signal, and the forth voltage is closer to the standard voltage compared to the third voltage. In addition, a margin range of the second voltage and a margin range of the forth voltage are adjusted together according to a margin adjusting signal. Thereby, time required for testing the first circuit and the second circuit can be decreased, so as to lower the cost.

REFERENCES:
patent: 7400996 (2008-07-01), Percer et al.
patent: 2007/0200832 (2007-08-01), Cho et al.

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