Ground bounce protection circuit for a test mode pin

Details Ground bounce protection circuit for a test mode pin Ground bounce protection circuit for a test mode pin

2007-05-01

2007-05-01

Zweizig, Jeffrey (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Gating

Signal transmission integrity or spurious noise override

C326S016000, C326S083000, C327S408000, C327S427000

Reexamination Certificate

active

11210136

ABSTRACT:
A test-mode circuit allows the same pad of a semiconductor device to be used as a test pad during test operations and as an I/O pad during normal operations. The test-mode circuit is coupled between the pad and a reference signal (Vbg) of the device, and in response to a control signal (CTRL1) either couples the pad and the reference signal (Vbg) together or isolates the pad and the reference signal (Vbg) from each other. The test-mode circuit includes at least one NMOS transistor (MN1) and a PMOS transistor (MP1) connected in series between the pad and the reference signal (Vbg). During normal operation, the NMOS transistor (MN1) isolates the reference signal (Vbg) from the pad, and the PMOS transistor (MP1) compensates for voltage undershoot conditions at the pad.

REFERENCES:
patent: 4574273 (1986-03-01), Atsumi et al.
patent: 4926070 (1990-05-01), Tanaka et al.
patent: 5136191 (1992-08-01), Nunogami
patent: 5151616 (1992-09-01), Komuro
patent: 5416368 (1995-05-01), Sugibayashi
patent: 5534795 (1996-07-01), Wert et al.
patent: 5644265 (1997-07-01), Austin et al.
patent: 5650742 (1997-07-01), Hirano
patent: 5894230 (1999-04-01), Voldman
patent: 6052321 (2000-04-01), Roohparvar
patent: 6147540 (2000-11-01), Coddington
patent: 6335636 (2002-01-01), Yeung et al.
patent: 6359493 (2002-03-01), Satomi
patent: 6822475 (2004-11-01), Loughmiller

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