Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1986-03-10
1988-06-07
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Plural, automatically sequential tests
324 73AT, 371 15, G01R 3102
Patent
active
047499478
ABSTRACT:
A new test structure is described which allows full testing of highly complex Integrated Circuits. The test structure consists of a grid of externally as well as individually accessible probe-lines and sense-lines with electronic switches at the crossings of said probe and the sense-lines. One end of the switches is tied to an array of test-points on the IC that are to be either monitored or controlled during the testing, and the other end of the switches is tied to a sense-line. The ON and the OFF states of the switches are controlled by probe-lines. The probe and sense lines are connected to test electronics, thus permitting the test electronics to control the electrical signals on the probe-lines and to measure or apply signals on the sense-lines. Thus, by the excitation of an appropriate probe-line and the monitoring of an appropriate sense-line, the test signals present at any one of the test-points can be measured. Conversly, by the excitation of an appropriate probe-line and application of a test signal on another appropriate sense-line the electrical signal on any of the test-points can be externally controlled for the purpose of testing.
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Burns W.
Cross-Check Systems, Inc.
Eisenzopf Reinhard J.
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