Grazing incidence reflection spectrometer

Details Grazing incidence reflection spectrometer Grazing incidence reflection spectrometer

1984-12-03

1987-03-31

McGraw, Vincent P.

Optics: measuring and testing

Infrared and ultraviolet

250372, 356327, 356445, G01J 332

Patent

active

046539085

ABSTRACT:
The present invention consists in a grazing incidence reflection spectrometer wherein light is caused to incide on a surface of a sample, and an intensity of light reflected from the sample surface is detected, thereby to measure an electronic absorption spectrum of a material adsorbed to the sample surface, characterized in that the incident light is visible light or ultraviolet light, and that the incident light has a predetermined glancing angle to the sample surface.

REFERENCES:
patent: 3765773 (1973-10-01), Weiner
patent: 3880524 (1975-04-01), Dill et al.
patent: 4077720 (1978-03-01), Kasai
patent: 4264209 (1981-04-01), Brewster
patent: 4521522 (1985-06-01), Lundstrom et al.
Sparrow et al., "Reflection Polarization by a Transparent-Film-Absorbing-Substrate System", vol. 62, No. 10, Oct. 1972, pp. 1188-1194, Journ. of Optical Society of America.
Kawamura et al., "Surface Structure Analysis by X-ray Spectroscopy & Diffraction" Jour. of the Spectroscopical Society of Japan, vol. 31, #4, 1982, pp. 269-281.
Suetaka, "Spectroscopies in Infrared Visible, & Near Ultraviolet Regions for the Investigation of Solid Surfaces" Jour. of the Spectroscopical Society of Japan, vol. 31, #3, 1982, pp. 195-210.

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