Grating pattern projection apparatus using liquid crystal...

Details Grating pattern projection apparatus using liquid crystal... Grating pattern projection apparatus using liquid crystal...

2006-03-07

2006-03-07

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Shape or surface configuration

Triangulation

Reexamination Certificate

active

07009718

ABSTRACT:
A lattice pattern projector for measuring a three-dimensional shape with enhanced accuracy while shortening the measuring time using a lattice pattern projection method, characterized by comprising a light source section (101), a liquid crystal lattice (111), a section (102) for projecting a lattice pattern, formed by passing the outgoing light from the light source section through the liquid crystal lattice, to an object for measurement, a section (112) for driving the liquid crystal lattice such that a linear intensity distribution is present in one period of the lattice pattern, a section (104) for detecting the lattice pattern projected to the object for measurement and deformed, and an operating section (114) for converting the linear intensity distribution in each period of the deformed lattice pattern into a linear phase distribution having a phase varying linearly.

REFERENCES:
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patent: 4837732 (1989-06-01), Brandestini et al.
patent: 5450204 (1995-09-01), Shigeyama et al.
patent: 4-98106 (1992-03-01), None
patent: 11-83454 (1999-03-01), None
patent: 2001-108422 (2001-04-01), None

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