Grating output wavefront sampling system

Details Grating output wavefront sampling system Grating output wavefront sampling system

1978-07-07

1980-12-16

Corbin, John K.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

350162R, G01B 902, G02B 518

Patent

active

042393922

ABSTRACT:
A grating output wavefront sampling system having a plurality of weak gratings located on the last mirror of a beam expander utilized in conjunction with a quasi-monochromatic light source. The gratings diffract a portion of the projected beam of light to a plurality of wavefront sensors, one sensor being utilized for each grating. Knowledge of the direction of the diffracted beams obtained from the wavefront sensors give information about the direction of the projected beam by virtue of conventional grating equations and Hartmann-subaperture tilt analysis. Consequently, if the wavelength and grating spacing are known, tilt and wavefront accuracy of the projected ray or beam are readily attainable.

REFERENCES:
patent: 3090279 (1963-05-01), Chisholm
patent: 3603690 (1971-09-01), Hard
Erikson, K. E., "Fabrication and Evaluation of a Weak Zone Plate for Monitoring Performance of Large Orbiting Telescopes", NASA CR112080, N7230891, Jul. 1972.
Erikson, K. E., "Investigation Monitoring and Control of Large Telescope Performances", NASA CR118, N7119019, Sep. 1970.
Harris, J. S., "Diffraction Grating Beam Sampling Technology", AFWL-TR-72140, AD762306, May 1973.
Harris, J. S., "Diffraction Grating Development", AFWL-TR-74218, ADA008199, Jul. 1974.
"Laser Wavefront Analyzer Using Frequency Offset Interferometry", Report AFWL-TR-74-26, AD922980, Jul. 1974.

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