Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1989-12-12
1991-07-30
Willis, Davis L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
G01B 902
Patent
active
050355074
ABSTRACT:
A grating-interference type displacement meter apparatus is disclosed wherein a convex lens or a concave mirror is disposed such that a focal point thereof is placed on a refraction plane or a diffraction plane of a diffraction grating, or wherein zeroth-order beams transmitted through the diffraction grating are reflected back in the same direction by a rectangular prism or a triangular prism for reentrance thereof onto the diffraction grating. Hereby, a plurality of optical beams produced by the diffraction grating are directed to propagate parallely to directions of propagation thereof defined in its design.
REFERENCES:
patent: 4629886 (1986-12-01), Akiyama et al.
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4930895 (1990-06-01), Nishimura et al.
patent: 4979826 (1990-12-01), Ishizuka et al.
Itabashi Tatsuo
Nishioki Nobuhisa
Koren Matthew W.
Mitutoyo Corporation
Willis Davis L.
LandOfFree
Grating-interference type displacement meter apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Grating-interference type displacement meter apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Grating-interference type displacement meter apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1539201