Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-05-15
2000-08-29
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356345, 356351, G01B 902
Patent
active
061116459
ABSTRACT:
An apparatus for performing high speed scanning of an optical delay and its application for performing optical interferometry, ranging, and imaging, including cross sectional imaging using optical coherence tomography, is disclosed. The apparatus achieves optical delay scanning by using diffractive optical elements in conjunction with imaging optics. In one embodiment a diffraction grating disperses an optical beam into different spectral frequency or wavelength components which are collimated by a lens. A mirror is placed one focal length away from the lens and the alteration of the grating groove density, the grating input angle, the grating output angle, and/or the mirror tilt produce a change in optical group and phase delay. This apparatus permits the optical group and phase delay to be scanned by scanning the angle of the mirror. In other embodiments, this device permits optical delay scanning without the use of moving parts.
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Bouma Brett E.
Fujimoto James G.
Tearney Guillermo
Kim Robert H.
Massachusetts Institute of Technology
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