Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2005-05-17
2005-05-17
Nolan, Jr., Charles H. (Department: 2854)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C073S602000
Reexamination Certificate
active
06894506
ABSTRACT:
The spectral content of the interference response at a sensor array is taken into account and used to advantage in remote sensing or imaging an object or scene. The phase relationship between sensor elements is preserved, enabling the natural interference spectrum to be processed to generate a particular spatial response of the aggregate beam pattern. The method applies to diverse forms of broadband illumination or emissions including acoustic and electromagnetic radiation, and provides remote sensing capabilities linked to the sensor elements appropriate to the wavelength band of interest (e.g., acoustic, RF or optical). Since the relative geometry between the source, scene and sensing array is responsible for the generation of a desirable interference response, the source of illumination need only maintain a small degree of coherence (some finite correlation length), and can operate in a pulsed or continuous (CW) mode. For passive sensing, the method can be applied to emissions derived from the object/scene itself. The processing technique exploits specific frequency/time domain features of the interference response and can apply them to a number of useful purposes including: 1) remote imaging of a scene, 2) remote characterization of an object of interest and 3) characterization of an intervening media between a source and the sensor array.
REFERENCES:
patent: 3805596 (1974-04-01), Klahr
patent: 4173007 (1979-10-01), McKeighen et al.
patent: 4630051 (1986-12-01), Adams et al.
patent: 4717916 (1988-01-01), Adams et al.
patent: 5132693 (1992-07-01), Werp
patent: 20040073101 (2004-04-01), Chance
Mohan Paul L.
Poplawski James E.
Gifford Krass Groh Sprinkle Anderson & Citkowski PC
Nolan, Jr. Charles H.
Veridian Systems
LandOfFree
Grating array processing methods and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Grating array processing methods and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Grating array processing methods and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3400840