Graphical automated machine control and metrology

Details Graphical automated machine control and metrology Graphical automated machine control and metrology

2005-05-03

2005-05-03

Picard, Leo (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S166000, C700S182000

Reexamination Certificate

active

06889113

ABSTRACT:
A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.

REFERENCES:
patent: 3877019 (1975-04-01), Auerbach et al.
patent: 5163006 (1992-11-01), Deziel
patent: 5815154 (1998-09-01), Hirschtick et al.
patent: 5926176 (1999-07-01), McMillan et al.
patent: 5970243 (1999-10-01), Klein et al.
patent: 6058333 (2000-05-01), Klein et al.
patent: 6064386 (2000-05-01), Felser et al.
patent: 6065858 (2000-05-01), Yamaguchi et al.
patent: 6118448 (2000-09-01), McMillan et al.
patent: 6191850 (2001-02-01), Chiang
patent: 6219055 (2001-04-01), Bhargava et al.
patent: 6232985 (2001-05-01), Chase et al.
patent: 6798515 (2004-09-01), Bachelder et al.
patent: 20030223066 (2003-12-01), Lee et al.

Affiliated with

Also associated with

Rating

Graphical automated machine control and metrology does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Graphical automated machine control and metrology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Graphical automated machine control and metrology will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3433582