Optics: measuring and testing – For size of particles
Reexamination Certificate
2006-03-07
2006-03-07
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
For size of particles
C356S237100
Reexamination Certificate
active
07009703
ABSTRACT:
A particle inspection device includes a feeder configured to drop a particle through an image area, a reflector configured to provide a reflected view of the particle in the image area, and an image capturing device configured to capture an image of the particle in the image area such that the image includes at least a direct view of the particle and the reflected view of the particle. In addition, a method for inspecting a particle includes dropping the particle through an image area, providing a reflected view of the particle in the image area using a reflector, and capturing an image of the particle in the image area using an image capturing device so that the image includes a direct view of the particle and the reflected view of the particle.
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Canty Thomas M.
Marks Christian P.
O'Brien Paul J.
Owen Richard E.
Davidson Davidson & Kappel LLC
J.M.Canty Inc.
Pham Hoa Q.
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