Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1992-11-18
1994-04-12
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356361, G01B 902
Patent
active
053030338
ABSTRACT:
A gradient index measuring apparatus includes a device for generating a first light beam and a second light beam having coherence, a sample provided on a first optical path along which the first light beam travels, a device for combining the first light beams traveling along the first optical path, transmitted through the sample, with the second light beam traveling along a second optical path, and a device for measuring interference fringes produced by the combination of the first and second light beams to calculate a gradient index of the sample from its measured value. Thus, the gradient index measuring apparatus is capable of measuring the gradient index provided in a radial direction in particular, with a high grade of accuracy, of a gradient index lens, and allows the measurement of asymmetry of the gradient index. Whereby, the quality of the measured sample is determined and the information of the measured asymmetry can be used as tolerance data in the design.
REFERENCES:
patent: 4842408 (1989-06-01), Yoshii et al.
Univ. of Electrocommunications, "Subfringe Interferometry Fundamentals," Mitsuo Takeda, Oct. 1983 pp. 55-65.
Homogeneity testing by phase sampling interferometry, Johannes Schwider et al, Sep. 15, 1985/vol. 24, No. 18 Applied Optics pp. 3059-3061.
Kim Robert
Olympus Optical Co,. Ltd.
Turner Samuel A.
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