Glitch noise producing semiconductor device for testing semicond

Details Glitch noise producing semiconductor device for testing semicond Glitch noise producing semiconductor device for testing semicond

1995-08-17

1999-03-16

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, 365201, G01R 3128

Patent

active

058835210

ABSTRACT:
A semiconductor device capable of giving glitch noise to a test signal used in a noise test for the device. The semiconductor device includes an input circuit for receiving either a test signal supplied from a device tester or a control signal, and an internal circuit connected to the input circuit by a signal line. The internal circuit operates based on a signal provided from the input circuit. The signal line is connected to a noise generator. The noise generator generates glitch noise in a test signal supplied from the tester.

REFERENCES:
patent: 3619780 (1971-11-01), Hoeks et al.
patent: 5170126 (1992-12-01), Wedge et al.
patent: 5442642 (1995-08-01), Ingalls et al.
patent: 5572160 (1996-11-01), Wadell

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