Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1997-11-10
2000-01-25
Chapman, John E.
Measuring and testing
Surface and cutting edge testing
Roughness
73660, G01B 1708
Patent
active
060166924
ABSTRACT:
A high resolution, low noise glide height test slider is provided to detect irregularities on a surface of a rotatable disc. A slider body is arranged to be supported by a support structure in predetermined spaced relation to the surface of the disc as it is rotating. A piezoelectric element on the slider body senses vibration forces acting on the slider body. The slider is electrically isolated from external noise sources.
REFERENCES:
patent: 5038625 (1991-08-01), Chen
patent: 5423207 (1995-06-01), Flechsig et al.
patent: 5488857 (1996-02-01), Homma et al.
patent: 5689064 (1997-11-01), Kennedy et al.
Boutaghou Zine-Eddine
Lin Zuxuan
Schaenzer Mark J.
Chapman John E.
Seagate Technology Inc.
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