Thermal measuring and testing – Leak or flaw detection
Reexamination Certificate
2005-05-31
2005-05-31
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Leak or flaw detection
C374S007000, C374S208000, C073S105000, C029S603120, C029S603160
Reexamination Certificate
active
06899456
ABSTRACT:
Glide heads for the detection of asperities on a storage disc have a thermal transducer oriented along the air bearing surface. The thermal transducer generally is in electrical contact with a circuit to measure the electrical resistance of the thermal transducer. Preferred methods of depositing the thermal transducer involve the deposition of the thermal transducer on the smooth surface of a wafer prior to the slicing of individual sliders.
REFERENCES:
patent: 4333229 (1982-06-01), Ellenberger
patent: 4532802 (1985-08-01), Yeack-Scranton et al.
patent: 4564585 (1986-01-01), Blaske et al.
patent: 4635139 (1987-01-01), Nguyen et al.
patent: 4674875 (1987-06-01), Koizumi
patent: 4816743 (1989-03-01), Harms et al.
patent: 4881136 (1989-11-01), Shiraishi et al.
patent: 4942609 (1990-07-01), Meyer
patent: 4961121 (1990-10-01), Astheimer et al.
patent: 5137750 (1992-08-01), Amin et al.
patent: 5177860 (1993-01-01), Yura et al.
patent: 5270882 (1993-12-01), Jove et al.
patent: 5372427 (1994-12-01), Padovani et al.
patent: 5423111 (1995-06-01), Mori
patent: 5423207 (1995-06-01), Flechsig et al.
patent: 5424638 (1995-06-01), Huber
patent: 5452166 (1995-09-01), Aylwin et al.
patent: 5509554 (1996-04-01), Samuelson et al.
patent: 5527110 (1996-06-01), Abraham et al.
patent: 5528922 (1996-06-01), Baumgart et al.
patent: 5537034 (1996-07-01), Lewis
patent: 5559051 (1996-09-01), Voldman et al.
patent: 5588199 (1996-12-01), Krounbi et al.
patent: 5603156 (1997-02-01), Biskeborn et al.
patent: 5605154 (1997-02-01), Ries et al.
patent: 5612839 (1997-03-01), Jacques
patent: 5689064 (1997-11-01), Kennedy et al.
patent: 5696643 (1997-12-01), Tsuwako et al.
patent: 5718035 (1998-02-01), Yamanaka et al.
patent: 5735036 (1998-04-01), Barr et al.
patent: 5761005 (1998-06-01), McKay et al.
patent: 5771571 (1998-06-01), Voldman et al.
patent: 5808184 (1998-09-01), Boutaghou et al.
patent: 5817931 (1998-10-01), Boutaghou
patent: 5818592 (1998-10-01), Womack et al.
patent: 5825181 (1998-10-01), Schaenzer et al.
patent: 5864054 (1999-01-01), Smith, Jr.
patent: 6003364 (1999-12-01), Yao et al.
patent: 6071007 (2000-06-01), Schaenzer et al.
patent: 6073337 (2000-06-01), Strom
patent: 6181520 (2001-01-01), Fukuda
patent: 6234599 (2001-05-01), Ishinaga et al.
patent: 6262572 (2001-07-01), Franco et al.
patent: 6360428 (2002-03-01), Sundaram et al.
patent: 6619105 (2003-09-01), Yao et al.
patent: 6623652 (2003-09-01), Hsiao et al.
patent: 6712985 (2004-03-01), Biskeborn
patent: 2002/0040595 (2002-04-01), Sundaram et al.
patent: 442 660 (1991-02-01), None
patent: 0 442 660 (1991-08-01), None
patent: 54-023517 (1979-02-01), None
patent: 56-107363 (1981-08-01), None
patent: 59-193580 (1984-02-01), None
patent: 04-245054 (1992-01-01), None
patent: 08-069674 (1996-03-01), None
patent: 08-212740 (1996-08-01), None
patent: 08-279132 (1996-10-01), None
patent: 08-287440 (1996-11-01), None
IBM Technical Disclosure Bulletin, vol. 26, No. 3A, Aug. 1983.*
“Thin Film Magnetic Heads”,IBM Technical Disclosure Bulletin, May 1979.
“Dimple/Air Bearing Surface Alignment Process”,IBM Technical Disclosure Bulletin, Mar. 1992.
U.S. Appl. No. 09/176,352, filed date Oct. 21, 1998.
Sundaram Ramesh
Yao Wei H.
Seagate Technology LLC
Verbitsky Gail
Westman Champlin & Kelly
LandOfFree
Glide head for asperity detection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Glide head for asperity detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Glide head for asperity detection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3369716