Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2011-01-25
2011-01-25
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
By polarized light examination
C356S239400, C356S240100
Reexamination Certificate
active
07876437
ABSTRACT:
An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.
REFERENCES:
patent: 5001353 (1991-03-01), Okake et al.
patent: 6962670 (2005-11-01), Hanson
patent: 7385710 (2008-06-01), Sturgill
patent: 2003/0193672 (2003-10-01), Okada et al.
Anton, Johan and Aben, Hillar, “A Compact Scattered Light Polariscope for Residual Stress Measurement in Glass Plates,” Institute of Cybernetics. A poster presented at the Glass Processing Days show in Tampere, Finland, on Jun. 15-18, 2003.
Furnas William J.
Tennekoon Sarath K.
Weber Gary C.
Emhart Glass S.A.
Punnoose Roy
Reinhart Boerner Van Deuren s.c.
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