Fishing – trapping – and vermin destroying
Patent
1992-03-17
1993-07-06
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 11, 437 13, 148DIG60, H01L 2100, H01L 2102, H01L 2130, H01L 21306
Patent
active
052253554
ABSTRACT:
A gettering treatment process comprises the step of irradiating an ultraviolet light onto an insulating layer (a silicon oxide thin layer formed by thermally oxidizing silicon), in a chlorine-containing gas atmosphere. The ultraviolet light excites and dissociates the chlorine-containing gas thereby to generate chlorine radicals which uniformly penetrate the insulating layer, and serve to trap metal impurities within the silicon oxide thin layer.
REFERENCES:
patent: 3933530 (1976-01-01), Mueller et al.
patent: 4109030 (1978-08-01), Briska et al.
patent: 4268538 (1981-05-01), Toole et al.
patent: 4735916 (1988-04-01), Homma et al.
patent: 4810673 (1989-03-01), Freeman
Romen, Hydrogen, Chloride and Chlorine Gettering, J. Electrochem. Soc., vol. 119, No. 3, 1972, pp. 747-752.
Sze, VLSI Technology, p. 472, 1983, McGraw-Hill.
Solid State Technology, vol. 22, No. 8, Aug. 1979, pp. 113-119; J. Monkowski: "Role of chlorine in silicon oxidation."
Japanese Journal of Applied Physics, Supplements 16th Int. Conf. Solid State Devices and Materials, Kobe, 30th Aug.-1st Sep. 1984, pp. 50-51, Tokyo, JP; K. Horioka et al.: "XeCl excimer laser oxidation of Si employing 02/Cl2 gas mixture."
Solid State Technology, vol. 25, No. 7, Jul. 1982, pp. 83-86, Port Washington, New York, U.S.; T. Hattori: "Chlorine oxidation and annealing in the fabrication of high performance LSI devices."
Ito Takashi
Nara Yasuo
Sugino Rinshi
Everhart B.
Fujitsu Limited
Hearn Brian E.
LandOfFree
Gettering treatment process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Gettering treatment process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gettering treatment process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1689090