Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1979-11-13
1982-05-25
Ruehl, Charles A.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73 1B, 7386167, G01B 720, G01L 122
Patent
active
043310354
ABSTRACT:
A thin film strain gage structure (10,110) for measuring the strain of an inflectible element (12,112) wherein the gage is formed on a surface (15,115) of the element and includes a sensing resistance (16,116) and an adjusting resistance portion (21,121). Connecting taps are formed in relationship to the resistors to permit adjustment of the adjusting resistor values by suitable connection to selected ones of the taps. The adjusting resistance is preferably disposed adjacent the sensing resistance so as to be subject to similar ambient conditions. The sensing resistance may be provided in the form of a Wheatstone bridge circuit with the adjusting resistors connected in series with two legs of the bridge. Adjustment of the adjusting resistance may be effected selectively by shorting out portions thereof or by suitably connecting to different portions thereof. In one form, the adjustment is effected so as to provide variable ratio between two portions of the resistance connected between legs of the bridge circuit.
REFERENCES:
patent: 2547926 (1951-04-01), Cook
patent: 2677271 (1954-05-01), Faris, Jr. et al.
patent: 3303693 (1967-02-01), Stedman
patent: 3697918 (1972-10-01), Orth et al.
patent: 4185496 (1980-01-01), Tisone et al.
patent: 4217785 (1980-08-01), Spoor
Eisele Walter H.
Koneval Donald J.
Krueger Helmut H. A.
Lajos Robert E.
Gould Inc.
Ruehl Charles A.
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