Image analysis – Applications – Document or print quality inspection
Reexamination Certificate
2006-01-17
2006-01-17
Johns, Andrew W. (Department: 2621)
Image analysis
Applications
Document or print quality inspection
C382S135000
Reexamination Certificate
active
06987868
ABSTRACT:
A genuine/counterfeit discrimination method, comprising identifying a combination of at least two of an electric field pattern, a magnetic pattern, an electron beam responsive pattern, and reflection or absorption patterns of visible light, ultraviolet light, and infrared light using an electric field, a magnetic field, an electron beam, visible light, ultraviolet light, or infrared light. A genuine/counterfeit discrimination object, wherein a combination of at least two of an electric field pattern, a magnetic pattern, an electron beam responsive pattern, and reflection or absorption patterns of visible light, ultraviolet light, and infrared light can be identified therein using an electric field, a magnetic field, an electron beam, visible light, ultraviolet light, or infrared light. And a genuine/counterfeit discrimination device comprising at least two devices selected from a device for identifying an electric field pattern, a device for identifying a magnetic pattern, a device for identifying an electron beam responsive pattern, a device for identifying a visible-light pattern, a device for identifying an ultraviolet-light pattern, and a device for identifying an infrared-light pattern and further comprising a device for comparing and identifying patterns obtained with these identification devices.
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Atarashi Takafumi
Nakatsuka Katsuto
Johns Andrew W.
Nakatsuka Katsuto
Nakhjavan Shervin
Nittetsu Mining Co., Ltd.
Sughrue & Mion, PLLC
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