Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
Reexamination Certificate
2011-06-21
2011-06-21
Levin, Naum (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Design of semiconductor mask or reticle
Analysis and verification
C716S106000, C716S111000, C714S025000, C714S030000, C713S151000
Reexamination Certificate
active
07966581
ABSTRACT:
Method and apparatus for constructing and operating an integrated circuit in an electronic device. In some embodiments, a generic service layer is integrated in a three dimensional integrated circuit and tested using a testing pattern stored in a non-volatile memory. The generic service layer is reconfigured to a permanent non-testing functional component of the integrated circuit.
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Chen Yiran
Li Hai
Liu Hongyue
Setiadi Dadi
Xi Haiwen
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Levin Naum
Seagate Technology LLC
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