Generation of pattern data with no overlapping or excessive...

Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C345S030000

Reexamination Certificate

active

07612847

ABSTRACT:
A device is disclosed for generating pattern data for unevenness that is randomly arranged on the surface of the reflective substrate of a reflective liquid crystal display device. The number of coordinates, a basic pitch, a movable range, and a dot diameter are entered from a data entry unit. An array generation unit regularly arranges base coordinates in two dimensions in accordance with the basic pitch. Coordinate displacement unit randomly displaces within the movable range at a portion of the basic coordinates to generate a multiplicity of displaced coordinates. Pattern generation unit arranges dot patterns with the dot diameter entered at each of the displaced coordinates generated to generate pattern data.

REFERENCES:
patent: 4061820 (1977-12-01), Magid et al.
patent: 4574311 (1986-03-01), Resnikoff et al.
patent: 5119235 (1992-06-01), Umeda et al.
patent: D331665 (1992-12-01), Underhill
patent: 5733710 (1998-03-01), Kuboya et al.
patent: 5936688 (1999-08-01), Tsuda et al.
patent: 5965327 (1999-10-01), Kuboya et al.
patent: 6181396 (2001-01-01), Kanoh et al.
patent: 6219113 (2001-04-01), Takahara
patent: 6221561 (2001-04-01), Kuboya et al.
patent: 6254965 (2001-07-01), McGuire et al.
patent: 6421052 (2002-07-01), McGuire
patent: 6522375 (2003-02-01), Jang et al.
patent: 6665030 (2003-12-01), Hanazawa et al.
patent: 7173659 (2007-02-01), Berstis
patent: 7277143 (2007-10-01), Funahata et al.
patent: 2003/0011618 (2003-01-01), Deering
patent: 2004/0239844 (2004-12-01), Kanoh et al.
patent: 2005/0030452 (2005-02-01), Jang
patent: 2005/0083454 (2005-04-01), Sumi
patent: 2005/0248702 (2005-11-01), Hoshino
patent: 2005/0264728 (2005-12-01), Funahata et al.
patent: 2007/0091247 (2007-04-01), Onda
patent: 2007/0146577 (2007-06-01), Sumi
patent: 59-208536 (1984-11-01), None
patent: 6167602 (1994-06-01), None
patent: 8184846 (1996-07-01), None
patent: 9292504 (1997-11-01), None
patent: 2912176 (1999-06-01), None
patent: 2000-292785 (2000-10-01), None
patent: 2000-338480 (2000-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Generation of pattern data with no overlapping or excessive... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Generation of pattern data with no overlapping or excessive..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Generation of pattern data with no overlapping or excessive... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4120585

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.