Generation of a testbench for a representation of a device

Details Generation of a testbench for a representation of a device Generation of a testbench for a representation of a device

2003-12-23

2008-10-28

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

07444257

ABSTRACT:
A system and method for generating a testbench for a representation of a device to be incorporated in a data processing apparatus is provided. The representation of the device is configurable based on configuration data specifying predetermined attributes of one or more components of the data processing apparatus with which that device is to be coupled, and the testbench provides a test environment that represents those one or more components. The method includes receiving the configuration data used to configure the representation of the device, and generating the testbench with reference to the configuration data and a first set of templates defining the test environment. By this approach, a matching testbench can automatically be generated for any particular instantiation of the configurable representation of the device to enable thorough verification testing of that instantiation of the device to be performed.

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