Optics: measuring and testing – Dimension
Reexamination Certificate
2005-09-13
2005-09-13
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Dimension
C356S328000, C356S601000, C250S559220, C702S155000
Reexamination Certificate
active
06943900
ABSTRACT:
A method of generating a library of simulated-diffraction signals (simulated signals) of a periodic grating includes obtaining a measured-diffraction signal (measured signal). Hypothetical parameters are associated with a hypothetical profile. The hypothetical parameters are varied within a range to generate a set of hypothetical profiles. The range to vary the hypothetical parameters is adjusted based on the measured signal. A set of simulated signals is generated from the set of hypothetical profiles.
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Jakatdar Nickhil
Niu Xinhui
Morrison & Foerster / LLP
Punnoose Roy M.
Timbre Technologies, Inc.
Toatley , Jr. Gregory J.
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