Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate
2006-09-11
2011-10-11
Jones, Hugh (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Event-driven
Reexamination Certificate
active
08036871
ABSTRACT:
A mechanism to dynamically vary the amount of delay for an event-generated function call is discussed. The event causing the generation of the function call may be a signal-based event, function call event or some other type of event. A function call generating delay component is inserted into a DES model and dynamically adjusts the amount of delay to apply prior to generating and transmitting the function call to an intended target component. The function call generating component reads a value from an input port in determining the amount of delay. The identified value at the input port may be a signal value or an attribute associated with an event entity received at the port.
REFERENCES:
patent: 5371851 (1994-12-01), Pieper et al.
patent: 6466898 (2002-10-01), Chan
patent: 7487077 (2009-02-01), Clune et al.
Apte Anuja Dilip
Clune Michael I.
Jones Hugh
Nelson Mullins Riley & Scarborough LLP
The MathWorks, Inc.
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