Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2011-01-18
2011-01-18
Tsai, H. Jey (Department: 2895)
Semiconductor device manufacturing: process
With measuring or testing
C438S460000, C438S462000, C257SE21524
Reexamination Certificate
active
07871832
ABSTRACT:
The generation of a chip identifier supporting at least one integrated circuit, which includes providing a cutout of least one conductive path by cutting the chip, the position of the cutting line relative to the chip conditioning the identifier.
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Jorgenson Lisa K.
McClellan William R.
STMicroelectronics S.A.
Tsai H. Jey
Wolf Greenfield & Sacks P.C.
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