Amplifiers – With amplifier condition indicating or testing means
Patent
1998-10-22
2000-01-04
Pascal, Robert
Amplifiers
With amplifier condition indicating or testing means
330 51, G01R 1900, H03F 114
Patent
active
060114339
ABSTRACT:
Within the field of integrated circuits used in amplifiers, a structure and improved method for calibrating a switched capacitor gain stage wherein the time required to self-calibrate a switched capacitor gain stage and the associated structure are reduced. The invention utilizes only a single calibration step which is performed while the output of the amplifier being calibrated is monitored. Instead of utilizing a plurality of capacitors C.sub.a1 --C.sub.an each in parallel with groups of trim capacitors C.sub.T, a single capacitor C.sub.a is used and connected to switches S.sub.1a1 and S.sub.1b1. Further, instead of a group of trim capacitors C.sub.T being connected in parallel with the capacitor to be trimmed, each of plurality of trim capacitors C.sub.T1 -C.sub.TN is connected between the input to the operational amplifier and a respective corresponding switch S.sub.1a2 -S.sub.1aN to the input reference voltage node V.sub.b0. As well, switches S.sub.1b2 -S.sub.1bn connect the respective junctions between the trim capacitors C.sub.T1 -C.sub.TN to ground.
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patent: 5847600 (1998-12-01), Brooks et al.
Nguyen Patricia T.
Pascal Robert
PMC-Sierra Ltd.
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