Data processing: database and file management or data structures – Database design – Data structure types
Reexamination Certificate
2006-11-07
2006-11-07
Gaffin, Jeffrey (Department: 2165)
Data processing: database and file management or data structures
Database design
Data structure types
C707S793000, C714S015000, C714S020000
Reexamination Certificate
active
07133883
ABSTRACT:
Diagnosis of corruption in interrelated data entities uses a graph of nodes and edges. Datum nodes represent the data entities, relationship nodes represent the relationships among the data entities. The datum nodes are connected through their relationship nodes by the edges. When corruption is detected, the relationships are analyzed and each edge connecting a datum node to a relationship node is removed from the graph when the corresponding relationship is invalid. The datum nodes that remain connected to their relationship nodes form a subgraph and the corresponding data entities are considered correct. In one aspect, if more than one subgraph is formed, the datum nodes in the largest are used. In another aspect, the data entities and relationships are analyzed to create the graph when the data entities are assumed correct. The data entities may be data and metadata of various types that can be associated with the data.
REFERENCES:
patent: 4479196 (1984-10-01), Ferrer et al.
patent: 5197148 (1993-03-01), Blount et al.
patent: 5201044 (1993-04-01), Frey et al.
patent: 5206939 (1993-04-01), Yanai et al.
patent: 5692184 (1997-11-01), Ardoin et al.
patent: 5720026 (1998-02-01), Uemura et al.
patent: 5796934 (1998-08-01), Bhanot et al.
patent: 5819275 (1998-10-01), Badger et al.
patent: 5835085 (1998-11-01), Eick et al.
patent: 5889934 (1999-03-01), Peterson
patent: 5909688 (1999-06-01), Yoshioka et al.
patent: 5933831 (1999-08-01), Jorgensen
patent: 5995308 (1999-11-01), Assouad et al.
patent: 6009542 (1999-12-01), Koller et al.
patent: 6343343 (2002-01-01), Menon et al.
patent: 6347359 (2002-02-01), Smith et al.
patent: 6397309 (2002-05-01), Kedem et al.
patent: 6408416 (2002-06-01), Morley et al.
patent: 6418519 (2002-07-01), Cadden et al.
patent: 6438591 (2002-08-01), Fehskens et al.
patent: 6467060 (2002-10-01), Malakapalli et al.
patent: 6476814 (2002-11-01), Garvey
patent: 6484185 (2002-11-01), Jain et al.
patent: 6553511 (2003-04-01), DeKoning et al.
patent: 6584544 (2003-06-01), Morley et al.
patent: 6587962 (2003-07-01), Hepner et al.
patent: 6606629 (2003-08-01), DeKoning et al.
patent: 6629273 (2003-09-01), Patterson
patent: 6684289 (2004-01-01), Gonzalez et al.
patent: 6687791 (2004-02-01), Morrison
patent: 6728922 (2004-04-01), Sundaram et al.
patent: 6874001 (2005-03-01), Narang et al.
patent: 6880060 (2005-04-01), Talagala et al.
patent: 2003/0070042 (2003-04-01), Byrd
patent: 2003/0140299 (2003-07-01), Duncan et al.
patent: 2003/0145270 (2003-07-01), Holt et al.
patent: 2003/0163777 (2003-08-01), Holt
patent: 2003/0188216 (2003-10-01), Elko et al.
patent: 2003/0221155 (2003-11-01), Weibel et al.
patent: 2004/0123032 (2004-06-01), Talagala et al.
patent: 2004/0153746 (2004-08-01), Talagala et al.
EMC, “The EMC CIARiiON Data Integrity Difference”, May 2001, pp. 1-11.
Talagala Nisha D.
Wong Brian
Dorsey & Whitney LLP
Gaffin Jeffrey
Sun Microsystems Inc.
Veillard Jacques
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