Optics: measuring and testing – Crystal or gem examination
Patent
1974-10-02
1976-03-30
Borchelt, Archie R.
Optics: measuring and testing
Crystal or gem examination
356209, G01N 2100
Patent
active
039471209
ABSTRACT:
A device and method for obtaining an identification pattern of polished gemstones. The device comprises, in combination, means for holding the gemstone in a reproducible position, means for creating a collimated parallel light beam, a lens for projecting a pattern obtained by reflecting the collimated parallel light beam from the gemstone onto a plane recording medium facing a plane reference surface of the gemstone. The distinctive pattern may be projected onto the plane recording medium via beam-splitting means. The light used can be white, or monochromatic. Polarized light may be used. Rotation of the pattern about the reference point of the optical axis provides a pattern which may be evaluated automatically.
REFERENCES:
patent: 1799604 (1931-04-01), Read
patent: 3715165 (1973-02-01), Smith
patent: 3740142 (1973-06-01), Takubo
patent: 3858979 (1975-01-01), Elbe
Bar-Issac Charles
Frei Ephraim
Shtrikman Shmuel
Borchelt Archie R.
La Roche E. R.
Yeda Research and Development Co. Ltd.
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