Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-01-31
2006-01-31
Chawan, Sheela (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C382S159000, C382S190000, C700S029000, C703S002000
Reexamination Certificate
active
06993177
ABSTRACT:
A method for accurately and efficiently determining the location of points or entities in a machine vision image. A set of sub-models are constructed from a global training model representing objects viewed by the machine vision system. The set of sub-models are used to fix the actual location of user selected points or entities. Configuration of the sub-models is automated to ensure that the sub-models contain sufficiently stable features within optimally sized regions without requiring substantial user expertise. Located entities are compared to evaluate compliance with pre-selected tolerances.
REFERENCES:
patent: 5963670 (1999-10-01), Lipson et al.
patent: 5995652 (1999-11-01), Chiu et al.
patent: 6160907 (2000-12-01), Robotham et al.
patent: 6324299 (2001-11-01), Sarachik et al.
patent: 6411734 (2002-06-01), Bachelder et al.
patent: 6424734 (2002-07-01), Roberts et al.
patent: 6459820 (2002-10-01), Sarachik
Ivan A. Bachelder and Shimon Ullman, Contour Matching Using Local Affine Transformations, Massachusetts Institute of Technology Artificial Intelligence Laboratory, A.I. Memo No. 1326, Apr. 1992.
Cognex Corporation, Cognex MVS-8000 Series, CVL Vision Tools Guide, CVL 5.4 590-6271; Chapter 14, pp. 323-360.
Cognex Corporation, Cognex Checkpoint II, Tools Guide, Release 1.1, 590-6299, Chapter 12, pp. 197-202.
Chawan Sheela
Cognex Technology and Investment Corporation
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