Gauge calibration

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S601000, C702S097000

Reexamination Certificate

active

07112972

ABSTRACT:
A method of calibrating a gauge in particular for the measurement of film thickness, uses a calibration variable to compensate for short term changes in probe tip condition, instead of a constant value. A calibration constant is based only on the dielectric constant for a coating such as lacquer, and is independent of the probe tip variable.

REFERENCES:
patent: 4510577 (1985-04-01), Tsujii et al.
patent: 4587623 (1986-05-01), Regimand et al.
patent: 4996658 (1991-02-01), Baker
patent: 5138268 (1992-08-01), Mulkey et al.
patent: 5293132 (1994-03-01), Koch
patent: 5612782 (1997-03-01), Keranen et al.
patent: 5865059 (1999-02-01), Alessandro
patent: 6020264 (2000-02-01), Lustig et al.
patent: 6025787 (2000-02-01), Poduje et al.
patent: 6078042 (2000-06-01), Fellows
patent: 6369381 (2002-04-01), Troxler et al.
patent: 6617861 (2003-09-01), Joshi
patent: 2002/0149360 (2002-10-01), Le

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Gauge calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Gauge calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Gauge calibration will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3524129

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.